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akaturk Academic measurement
  1. Ana Dal Mühendislik Temel Alanı
  2. Yan Dal Elektrik-Elektronik Mühendisliği
Keywords YÖKSİS
Articles 11 YÖKSİS 11 · OpenAlex 0 Total citations 17 h-index 1 · OpenAlex Q1 articles 1 Scopus · WoS Q1 0 Best field rank #259 / 842 Side field · top 30.8% Co-authors 8 1 Turkish institutions

Citation impact

OpenAlex YÖKSİS articles matched in OpenAlex: 5 + YÖKSİS · co-author record: 1
h-index 1 Percentile in Türkiye: 8 #1,072 of 1,433 at their university by h-index
i10-index
1
Total citations
17
Top 63% in Türkiye
Per article
2.8
FWCI
0.49
1.00 = world average
World top 1%
0
World top 10%
0
How is this computed?

h-index and citations are computed from the citation counts of this academic’s YÖKSİS articles matched in OpenAlex (not Google Scholar, WoS or Scopus). Unmatched articles are not included. 1 articles (0 citations) tagged with this academic’s YÖK author id in co-authors’ YÖKSİS records count only towards citations, h-index and i10; article counts, percentiles and rankings use their own YÖKSİS list.

Field ranking

YÖKSİS ?
Keyword rankings 1

Collaboration network

From the author lists of YÖKSİS publication records. Duplicate records of a work count once; institutions are co-authors’ current YÖKSİS affiliations.

Co-authors
8
With an akaturk profile
6
Turkish institutions
1
Co-authored works
%91

Academic co-authors 6

  1. SERHAT ÖZDER Profesör · Çanakkale Onsekiz Mart Üniversitesi same university 7
  2. EMRE COŞKUN Profesör · Çanakkale Onsekiz Mart Üniversitesi same university 4
  3. ÖZLEM KOCAHAN YILMAZ Profesör · Tekirdağ Namık Kemal Üniversitesi 4
  4. SAVAŞ ELMAS Araştırma Görevlisi · Çanakkale Onsekiz Mart Üniversitesi same university 3
  5. VİLDAN BİLGİN Profesör · Çanakkale Onsekiz Mart Üniversitesi same university 3
  6. ULAŞ ÇINAR Öğretim Görevlisi (uygulamalı Birim) · Çanakkale Onsekiz Mart Üniversitesi same university 1

National collaboration 1 institutions

Within own university8 joint works · Çanakkale Onsekiz Mart Üniversitesi

  1. Tekirdağ Namık Kemal Üniversitesi 4 works · 1 academics

Other co-authors (incl. international) 2

GİZEM ÇINARMEHMET AKEL

Authors without an akaturk profile (international researchers, retired or former academics, students, clinicians) are grouped by name spelling; short forms such as “Gulluce M.” join the single full name they match.

Indexes and citation percentiles

?
TR Index 0 articles
OpenAlex citation percentile
Top 1%0
Top 10%0
Avg · n 7 %59.8
Other counts

Scopus (SJR)

  • YÖKSİS rows 3

WoS (JCR)

  • YÖKSİS rows 3

Articles

Articles with YÖKSİS and OpenAlex source split; narrow by quartile or TR Index.

11articles

Journals with publications

7 journals

Narrow down

Scopus (SJR)
Q11 Q21 Q31 Q40
WoS (JCR)
Q10 Q21 Q31 Q41
TR Index
0articles

Article list

  1. 2025 KİŞİSEL KORUYUCU DAĞITIMINDA OTOMAT SİSTEMİ TASARIMI TURAN-SAM ULUSLARARASI BİLİMSEL HAKEMLİ MEVSİMLİK DERGİSİ DOI 10.15189/1308-8041 YÖKSİS
  2. 2025 KAZA ANALİZİNDE YENİ BİR YAKLAŞIM ÖNERİSİ: TRUVA ATI MODELİ TURAN-SAM ULUSLARARASI BİLİMSEL HAKEMLİ MEVSİMLİK DERGİSİ DOI 10.15189/1308-8041 YÖKSİS
  3. 2021 İş Güvenliği Uzmanı Olma Yolunda İş Sağlığı ve Güvenliği Lisans Bölümlerinin Durumu TURAN-SAM Uluslararası Bilimsel Hakemli Dergisi DOI 10.15189/1308-8041 YÖKSİS
  4. 2021 Aydınlatmada Floresan Lamba ve Led Tüp Lambaların Karşılaştırılması ve Maliyet Analizi TURAN-SAM Uluslararası Bilimsel Hakemli Dergisi DOI 10.15189/1308-8041 YÖKSİS
  5. 2019 Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform Thin Solid Films DOI 10.1016/j.tsf.2019.137602 YÖKSİS SJR Q2 JCR Q3 OpenAlex 40.5%
  6. 2017 The generalized Morse wavelet method to determine refractive index dispersion of dielectric films Measurement Science and Technology DOI 10.1088/1361-6501/aa5dc4 YÖKSİS SJR Q1 JCR Q2 OpenAlex 0.9%
  7. 2017 An improved method for determination of refractive index of absorbing films: A simulation study American Institute of Physics DOI 10.1063/1.4976387 YÖKSİS OpenAlex 55.9%
  8. 2016 An improved method for the determination of birefringence dispersion of liquid crystal cell: A simulation study AIP Conference Proceedings DOI 10.1063/1.4944178 3 YÖKSİS records YÖKSİS OpenAlex 81.7%
  9. 2012 Influence of Annealing Temperature on the Electrical and Optical Properties of CdS Thin Films ACTA PHYSICA POLONICA A YÖKSİS
  10. 2012 Influence of Annealing Temperature on the Electricaland Optical Properties of CdS Thin Films ACTA PHYSICA POLONICA A YÖKSİS SJR Q3 JCR Q4 OpenAlex 76.1%
  11. 2012 Influence of Annealing Temperature on the Electrical and Optical Properties of CdS Thin Films Acta Physica Polonica A YÖKSİS

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