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Academician

EMRE COŞKUN

Profesör

Çanakkale Onsekiz Mart Üniversitesi Fen Fakültesi Fizik Bölümü

Research topics OpenAlex
  1. Ana Dal Fen Bilimleri ve Matematik Temel Alanı
  2. Yan Dal Fizik
Keywords YÖKSİS
Articles 34 YÖKSİS 34 · OpenAlex 0 Total citations 284 h-index 11 · OpenAlex Q1 articles 15 Scopus · WoS Q1 8 Best field rank #2,700 / 11,969 Main field · top 22.6% Co-authors 21 5 Turkish institutions

Citation impact

OpenAlex YÖKSİS articles matched in OpenAlex: 34 + YÖKSİS · co-author record: 1
h-index 11 Percentile in Türkiye: 84 #147 of 1,436 at their university by h-index
i10-index
12
Total citations
284
Top 21% in Türkiye
Per article
8.1
FWCI
0.54
1.00 = world average
World top 1%
0
World top 10%
0

Most cited articles

  1. Device behavior of an In p Ag Ga In Te2 n Si Ag heterojunction diode 2015 33 citations
  2. Optical phase distribution evaluation by using an S transform 2007 29 citations
  3. The effect of thermal annealing on impurity states in ferroelectric semiconductor TlGaSe2 within the incommensurate phase 2006 23 citations
How is this computed?

h-index and citations are computed from the citation counts of this academic’s YÖKSİS articles matched in OpenAlex (not Google Scholar, WoS or Scopus). Unmatched articles are not included. 1 articles (17 citations) tagged with this academic’s YÖK author id in co-authors’ YÖKSİS records count only towards citations, h-index and i10; article counts, percentiles and rankings use their own YÖKSİS list. h-index on the OpenAlex author profile: 10.

Field ranking

YÖKSİS ?
Keyword rankings 2

Collaboration network

From the author lists of YÖKSİS publication records. Duplicate records of a work count once; institutions are co-authors’ current YÖKSİS affiliations.

Co-authors
21
With an akaturk profile
9
Turkish institutions
5
Co-authored works
%100

Academic co-authors 9

  1. MEHMET PARLAK Profesör · Orta Doğu Teknik Üniversitesi 22
  2. İDRİS CANDAN Doçent · Kocaeli Üniversitesi 14
  3. ÖZGE SÜRÜCÜ Profesör · Ankara Yıldırım Beyazıt Üniversitesi 13
  4. SERHAT ÖZDER Profesör · Çanakkale Onsekiz Mart Üniversitesi same university 11
  5. ÖZLEM KOCAHAN YILMAZ Profesör · Tekirdağ Namık Kemal Üniversitesi 10
  6. SEÇKİN ÖZCAN Doktor Öğretim Üyesi · Çanakkale Onsekiz Mart Üniversitesi same university 4
  7. MAKBULE TERLEMEZOĞLU BİLMİŞ Doçent · Gazi Üniversitesi 2
  8. ADEM TATAROĞLU Profesör · Gazi Üniversitesi 1
  9. SEMA BİLGE OCAK Profesör · Gazi Üniversitesi 1

National collaboration 5 institutions

Within own university11 joint works · Çanakkale Onsekiz Mart Üniversitesi

  1. Orta Doğu Teknik Üniversitesi 22 works · 1 academics
  2. Kocaeli Üniversitesi 14 works · 1 academics
  3. Ankara Yıldırım Beyazıt Üniversitesi 13 works · 1 academics
  4. Tekirdağ Namık Kemal Üniversitesi 10 works · 1 academics
  5. Gazi Üniversitesi 3 works · 3 academics

Other co-authors (incl. international) 12

HASAN HÜSEYİN GÜLLÜ 20AYŞE ÇİĞDEM ERÇELEBİ 7Cansu Emir 6ERHAN TİRYAKİ 6Merve Naz Elmas 2Çağla Durmuş 2AREZOO HOSSEINIMehmet IsikNizami GasanlySemanur SELAMETecem bozdogantahir colakoglu

Authors without an akaturk profile (international researchers, retired or former academics, students, clinicians) are grouped by name spelling; short forms such as “Gulluce M.” join the single full name they match.

Indexes and citation percentiles

?
TR Index 0 articles
OpenAlex citation percentile
Top 1%0
Top 10%0
Avg · n 34 %52.4
Other counts

Scopus (SJR)

  • YÖKSİS rows 28

WoS (JCR)

  • YÖKSİS rows 28

Articles

Articles with YÖKSİS and OpenAlex source split; narrow by quartile or TR Index.

34articles

Journals with publications

21 journals

Narrow down

Scopus (SJR)
Q115 Q211 Q31 Q41
WoS (JCR)
Q18 Q211 Q36 Q43
TR Index
0articles

Article list

  1. 2026 Reflectance-Only Retrieval of Refractive Index and Extinction Coefficient Dispersions in an Absorbing Thin Film via a Paul-Wavelet Repetition-Frequency Method ACS Omega DOI 10.1021/acsomega.6c00253 YÖKSİS SJR Q1 JCR Q2 OpenAlex 67.0%
  2. 2024 Structural and Optical Properties of Interfacial InSe Thin Film ACS Omega DOI 10.1021/acsomega.3c06600 YÖKSİS SJR Q1 JCR Q2 OpenAlex 82.4%
  3. 2023 Nanowire geometry effects on devices and transport mechanisms: SnS2/SiNW heterojunction Journal of Materials Science DOI 10.1007/s10853-023-08891-9 YÖKSİS SJR Q1 JCR Q2 OpenAlex 43.9%
  4. 2023 A new method to determine the continuous refractive index of an absorbing film by Generalized Stockwell Transform Optics and Laser Technology DOI 10.1016/j.optlastec.2023.109711 YÖKSİS SJR Q1 JCR Q1 OpenAlex 34.0%
  5. 2021 Improvement of electrical characteristics of SnSe/Si heterostructure by integration of Si nanowires Physica B: Condensed Matter DOI 10.1016/j.physb.2020.412669 YÖKSİS SJR Q2 JCR Q3 OpenAlex 50.4%
  6. 2019 The zero order generalized Morse wavelet method to determine the refractive index and extinction coefficient dispersions of an absorbing film Thin Solid Films DOI 10.1016/j.tsf.2019.01.032 YÖKSİS SJR Q2 JCR Q3 OpenAlex 44.1%
  7. 2019 Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform Thin Solid Films DOI 10.1016/j.tsf.2019.137602 YÖKSİS SJR Q2 JCR Q3 OpenAlex 40.5%
  8. 2019 Optical band gap and dispersion of optical constants of Cu-Ga-S thin films Optik DOI 10.1016/j.ijleo.2019.04.035 YÖKSİS SJR Q2 JCR Q2 OpenAlex 50.0%
  9. 2019 title FABRICATION AND CHARACTERIZATION OF TiO sub2/sub THIN FILM FOR DEVICE APPLICATIONS/title Surface Review and Letters DOI 10.1142/S0218625X18502050 YÖKSİS SJR Q4 JCR Q4 OpenAlex 54.1%
  10. 2019 Effects of Si nanowire on the device properties of n-ZnSe/p-Si heterostructure JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS DOI 10.1007/s10854-019-00769-4 YÖKSİS SJR Q2 JCR Q2 OpenAlex 55.7%
  11. 2018 Determination of phase from the ridge of CWT using generalized Morse wavelet Measurement Science and Technology DOI 10.1088/1361-6501/aa9d56 YÖKSİS SJR Q1 JCR Q2 OpenAlex 73.8%
  12. 2017 The generalized Morse wavelet method to determine refractive index dispersion of dielectric films Measurement Science and Technology DOI 10.1088/1361-6501/aa5dc4 YÖKSİS SJR Q1 JCR Q2 OpenAlex 0.9%
  13. 2017 3D profile measurements of objects by using zero order Generalized Morse Wavelet AIP Conference Proceedings DOI 10.1063/1.4976373 YÖKSİS OpenAlex 0.6%
  14. 2017 Optical phase distribution evaluation by using zero order Generalized Morse Wavelet AIP Conference Proceedings DOI 10.1063/1.4976374 YÖKSİS OpenAlex 0.7%
  15. 2017 Investigations of thermal annealing role on the optical properties of Zn-In-Se thin films OPTIK DOI 10.1016/j.ijleo.2017.06.106 YÖKSİS SJR Q2 JCR Q3 OpenAlex 71.3%
  16. 2017 An improved method for determination of refractive index of absorbing films: A simulation study American Institute of Physics DOI 10.1063/1.4976387 YÖKSİS OpenAlex 55.9%
  17. 2017 A simulation study for determination of refractive index dispersion of dielectric film from reflectance spectrum by using Paul wavelet American Institiute of Physics DOI 10.1063/1.4976392 YÖKSİS OpenAlex 0.9%
  18. 2016 An improved method for the determination of birefringence dispersion of liquid crystal cell: A simulation study AIP Conference Proceedings DOI 10.1063/1.4944178 YÖKSİS OpenAlex 81.7%
  19. 2015 Device behavior of an In p Ag Ga In Te2 n Si Ag heterojunction diode MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING DOI 10.1016/j.mssp.2015.02.043 YÖKSİS SJR Q2 JCR Q1 OpenAlex 81.8%
  20. 2015 Investigation of optical parameters of thermally evaporated ZnSe thin films physica status solidi (c) DOI 10.1002/pssc.201510064 YÖKSİS SJR Q3 OpenAlex 73.3%

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