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Academician

CİHAN ÖNER

Doktor Öğretim Üyesi

Nevşehir Hacı Bektaş Veli Üniversitesi Mühendislik-Mimarlık Fakültesi Elektrik-Elektronik Mühendisliği Bölümü

Research topics OpenAlex
  1. Ana Dal Mühendislik Temel Alanı
  2. Yan Dal Elektrik-Elektronik ve Haberleşme Mühendisliği
Keywords YÖKSİS
Articles 3 YÖKSİS 3 · OpenAlex 0 Total citations 32 h-index 2 · OpenAlex OpenAlex coverage %100 matched 3 / 3 Q1 articles 1 Scopus · WoS Q1 0 Co-authors 6 0 Turkish institutions

Citation impact

Citation counts of the articles matched in OpenAlex, citing publications from Crossref and the Stanford/Elsevier list. Sources are shown separately and never added up.

OpenAlex YÖKSİS articles matched in OpenAlex: 3
h-index 2 Percentile in Türkiye: 28 #307 of 637 at their university by h-index
i10-index
1
Total citations
32
Top 55% in Türkiye
Per article
10.7
FWCI
1.06
1.00 = world average
World top 1%
0
World top 10%
0

Most cited articles

  1. Deep Levels in n-Type 4H-Silicon Carbide Epitaxial Layers Investigated by Deep-Level Transient Spectroscopy and Isochronal Annealing Studies 2016 29 citations
  2. Investigating 4H-SiC epilayer thickness variation in high-resolution Ni/Y₂O₃/4H-SiC MOS detectors 2025 3 citations
How is this computed?

h-index and citations are computed from the citation counts of this academic’s YÖKSİS articles matched in OpenAlex (not Google Scholar, WoS or Scopus). Unmatched articles are not included.

Citing publications Crossref 16 publications citing 3 DOI-bearing articles · 3 Türkiye-affiliated
  • 2017 2
  • 2019 7
  • 2020 3
  • 2021 2
  • 2025 1
  • 2026 1
  1. DOI 10.1109/ted.2025.3634063 2026
  2. Investigating 4H-SiC epilayer thickness variation in high-resolution Ni/Y₂O₃/4H-SiC MOS detectors TR Ritwik Nag et al. · Journal of Materials Science: Materials in Electronics · 2025
  3. DOI 10.1117/12.2596464 2021
  4. DOI 10.1063/5.0059151 2021
  5. DOI 10.1109/nss/mic42677.2020.9507936 2020
  6. DOI 10.3390/mi11030254 2020
  7. DOI 10.1016/j.jcrysgro.2019.125352 2020
  8. DOI 10.1109/ted.2019.2917534 2019
  9. DOI 10.1109/sslchinaifws49075.2019.9019805 2019
  10. DOI 10.1088/1674-4926/40/2/022804 2019
  11. DOI 10.3390/mi10120835 2019
  12. DOI 10.1016/j.diamond.2018.12.008 2019
  13. DOI 10.1117/12.2530184 2019
  14. DOI 10.1088/1674-1056/28/2/027303 2019
  15. Synthesis and Characterization of Amorphous Selenium Alloys Radiation Detectors TR Towhid A. Chowdhury et al. · 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) · 2017
  16. Deep Level Transient Spectroscopy and Pulse Height Measurements on High Resolution n-Type 4H-SiC Epitaxial Schottky Barrier Radiation Detectors TR Cihan Oner et al. · 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) · 2017
Where does this list come from?

Extracted from the reference lists in Crossref’s public March 2026 data file; 20.3% of the file has been processed, so the list may be incomplete. Crossref citations are never added to or compared with the OpenAlex citation counts; the two sources have different coverage.

Field ranking

Position in the main-field, side-field and keyword cohorts by YÖKSİS article score; each card opens that ranking.

YÖKSİS ?
Keyword rankings 1

Works 3

YÖKSİS and OpenAlex records: index distribution, journals published in, a filterable article list and the other output types.

Indexes and citation percentiles

?
TR Index 0 articles
OpenAlex citation percentile
Top 1%0
Top 10%0
Avg · n 3 %62.8
Other counts

Scopus (SJR)

  • YÖKSİS rows 3

WoS (JCR)

  • YÖKSİS rows 3

Articles

Articles with YÖKSİS and OpenAlex source split; narrow by quartile or TR Index.

3articles

Journals with publications

3 journals

Narrow down

Scopus (SJR)
Q11 Q22 Q30 Q40
WoS (JCR)
Q10 Q23 Q30 Q40
TR Index
0articles

Article list

  1. 2025 Metal-free (p+) diamond/(n)4H-SiC epitaxial Heterojunction Diodes for Radiovoltaic Applications IEEE Electron Device Letters DOI 10.1109/LED.2025.3640092 YÖKSİS SJR Q1 JCR Q2 OpenAlex 26.8%
  2. 2025 Investigating 4H-SiC epilayer thickness variation in high-resolution Ni/Y₂O₃/4H-SiC MOS detectors Journal of Materials Science: Materials in Electronics DOI 10.1007/s10854-025-16272-y YÖKSİS SJR Q2 JCR Q2 OpenAlex 72.9%
  3. 2016 Deep Levels in n-Type 4H-Silicon Carbide Epitaxial Layers Investigated by Deep-Level Transient Spectroscopy and Isochronal Annealing Studies IEEE Transactions on Nuclear Science DOI 10.1109/TNS.2016.2535212 YÖKSİS SJR Q2 JCR Q2 OpenAlex 88.6%

Books 4

  1. 2023 International Research in Engineering Sciences VIII Eğitim Yayınevi ISBN 978-625-6552-87-6 Kitap Bölümü · Bilimsel Kitap
  2. 2023 Interdisciplinary Studies on Contemporary Research Practices in Engineering in the 21st Centruy-IV Özgür Yayınları ISBN 978-975-447-769-6 Kitap Bölümü · Bilimsel Kitap
  3. 2023 Current Debates on Natural and Engineering Sciences 11 BIDGE Yayınları ISBN 978-625-6488-21-2 Kitap Bölümü · Bilimsel Kitap
  4. 2018 Reactor Dosimetry: 16th International Symposium ASTM International ISBN 978-0-8031-7662-1 Kitap Bölümü · Bilimsel Kitap

Proceedings 11 See all (11) →

  1. 2015 Investigation of thermally evaporated high resistive B-doped amorphous selenium alloy films and metal contact studies Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII
  2. 2015 Surface passivation and isochronal annealing studies on n-type 4H-SiC epitaxial layer Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII
  3. 2017 Synthesis and Characterization of Amorphous Selenium Alloys Radiation Detectors 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
  4. 2015 Characterization of Cdinf0.9/infZninf0.1/infTe single crystals for radiation detectors 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
  5. 2015 Defect characterization of Cd sub0.9/sub Zn sub0.1/sub Te crystals using electron beam induced current (EBIC) imaging and thermally stimulated current (TSC) measurements Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII

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Collaboration network

From the author lists of YÖKSİS publication records. Duplicate records of a work count once; institutions are co-authors’ current YÖKSİS affiliations.

Co-authors
6
With an akaturk profile
0
Turkish institutions
0
Co-authored works
%100

Academic co-authors 0

No co-author with an akaturk profile.

National collaboration 0 institutions

No joint work with another Turkish university.

Other co-authors (incl. international) 6

Krishna C Mandal 3Ritwig Nag 2Sandeep K. Chaudhuri 2Khai V NguyenMohammad A MannanRahmi O Pak

Authors without an akaturk profile (international researchers, retired or former academics, students, clinicians) are grouped by name spelling; short forms such as “Gulluce M.” join the single full name they match.