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Akademisyen

EMRE COŞKUN

PROFESÖR

ÇANAKKALE ONSEKİZ MART ÜNİVERSİTESİ FEN FAKÜLTESİ FİZİK BÖLÜMÜ

  • Ana Dal Fen Bilimleri ve Matematik Temel Alanı
  • Yan Dal Fizik

Kayıtlı çıktılara kısa bakış — ayrıntılar aşağıda.

  • Makale 33
  • Proje 0
  • Kitap 0
  • Bildiri 46
  • Patent 0
  • Sanatsal 0
Scopus (SJR) Q1 16 Q2 12 Q3 1 Q4 1
WoS (JCR) Q1 11 Q2 10 Q3 6 Q4 3
TR Index 0 makale

Alan+yıl+tür normalize OpenAlex yüzdelik — Clarivate ESI / SciVal değildir.

Üst %1 makale 0
Üst %10 makale 0
Ort. yüzdelik 54.5%
Üst %1 payı 0.0%
Üst %10 payı 0.0%

Makaleler

YÖKSİS ve OpenAlex kaynak ayrımıyla makaleler; quartile ve TR Index ile daraltabilirsiniz.

Dizin filtreleri

Toplam 33 yayın

Scopus (SJR)
Q1 16 Q2 12 Q3 1 Q4 1
WoS (JCR)
Q1 11 Q2 10 Q3 6 Q4 3
TR Index
0 makale

Makale listesi

  1. 2024 Structural and Optical Properties of Interfacial InSe Thin Film ACS Omega DOI 10.1021/acsomega.3c06600 YÖKSİS SJR Q1 JCR Q2 OpenAlex 82.4%
  2. 2023 A new method to determine the continuous refractive index of an absorbing film by Generalized Stockwell Transform Optics and Laser Technology DOI 10.1016/j.optlastec.2023.109711 YÖKSİS SJR Q1 JCR Q1 OpenAlex 35.2%
  3. 2021 Improvement of electrical characteristics of SnSe/Si heterostructure by integration of Si nanowires Physica B: Condensed Matter DOI 10.1016/j.physb.2020.412669 YÖKSİS SJR Q2 JCR Q3 OpenAlex 50.4%
  4. 2019 The zero order generalized Morse wavelet method to determine the refractive index and extinction coefficient dispersions of an absorbing film Thin Solid Films DOI 10.1016/j.tsf.2019.01.032 YÖKSİS SJR Q2 JCR Q3 OpenAlex 44.1%
  5. 2019 Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform Thin Solid Films DOI 10.1016/j.tsf.2019.137602 YÖKSİS SJR Q2 JCR Q3 OpenAlex 40.5%
  6. 2019 Optical band gap and dispersion of optical constants of Cu-Ga-S thin films Optik DOI 10.1016/j.ijleo.2019.04.035 YÖKSİS SJR Q2 JCR Q2 OpenAlex 50.0%
  7. 2019 title FABRICATION AND CHARACTERIZATION OF TiO sub2/sub THIN FILM FOR DEVICE APPLICATIONS/title Surface Review and Letters DOI 10.1142/S0218625X18502050 YÖKSİS SJR Q4 JCR Q4 OpenAlex 52.2%
  8. 2019 Effects of Si nanowire on the device properties of n-ZnSe/p-Si heterostructure JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS DOI 10.1007/s10854-019-00769-4 YÖKSİS SJR Q2 JCR Q2 OpenAlex 55.7%
  9. 2018 Determination of phase from the ridge of CWT using generalized Morse wavelet Measurement Science and Technology DOI 10.1088/1361-6501/aa9d56 YÖKSİS SJR Q1 JCR Q2 OpenAlex 73.8%
  10. 2017 The generalized Morse wavelet method to determine refractive index dispersion of dielectric films Measurement Science and Technology DOI 10.1088/1361-6501/aa5dc4 YÖKSİS SJR Q1 JCR Q2 OpenAlex 0.9%
  11. 2017 3D profile measurements of objects by using zero order Generalized Morse Wavelet AIP Conference Proceedings DOI 10.1063/1.4976373 YÖKSİS OpenAlex 0.6%
  12. 2017 Optical phase distribution evaluation by using zero order Generalized Morse Wavelet AIP Conference Proceedings DOI 10.1063/1.4976374 YÖKSİS OpenAlex 0.7%
  13. 2017 Investigations of thermal annealing role on the optical properties of Zn-In-Se thin films OPTIK DOI 10.1016/j.ijleo.2017.06.106 YÖKSİS SJR Q2 JCR Q3 OpenAlex 71.3%
  14. 2017 An improved method for determination of refractive index of absorbing films: A simulation study American Institute of Physics DOI 10.1063/1.4976387 YÖKSİS OpenAlex 55.9%
  15. 2017 A simulation study for determination of refractive index dispersion of dielectric film from reflectance spectrum by using Paul wavelet American Institiute of Physics DOI 10.1063/1.4976392 YÖKSİS OpenAlex 0.9%
  16. 2016 An improved method for the determination of birefringence dispersion of liquid crystal cell: A simulation study AIP Conference Proceedings DOI 10.1063/1.4944178 YÖKSİS OpenAlex 81.7%
  17. 2015 Investigation of optical parameters of thermally evaporated ZnSe thin films physica status solidi (c) DOI 10.1002/pssc.201510064 YÖKSİS SJR Q3 OpenAlex 73.3%
  18. 2015 Investigation of structural and optical parameters of Cu Ag In Se thin films deposited by thermal evaporation method Optik - International Journal for Light and Electron Optics DOI 10.1016/j.ijleo.2015.05.026 YÖKSİS SJR Q2 JCR Q4 OpenAlex 65.0%
  19. 2015 Generalized Morse wavelet for the determination of the birefringence of a liquid crystal cell MEASUREMENT SCIENCE & TECHNOLOGY DOI 10.1088/0957-0233/26/8/085204 YÖKSİS SJR Q1 JCR Q2 OpenAlex 7.4%
  20. 2015 Study on the Structural and Electrical Properties of Sequentially Deposited Ag Ga In Te Thin Films Journal of Low Temperature Physics DOI 10.1007/s10909-014-1245-y YÖKSİS SJR Q2 JCR Q4 OpenAlex 67.7%

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