Article detail · 2016 · article
A predictive model for wafer probe burn phenomenon
Journal
Applied Thermal Engineering
ISSN1359-4311
YÖKSİS
OpenAlex
Open access · green
Year2016
Citations6OpenAlex
Citations6Semantic Scholar · 1 influential
Percentile%66.5
FWCI0.321.00 = world average
Scopus (SJR)Q1
WoS (JCR)Q1
Data source split
- YÖKSİSYÖKSİS article record
- YÖKSİS venueApplied Thermal Engineering
- Catalog match (ISSN)Applied Thermal Engineering
- OpenAlexOpenAlex enrichment (abstract, citations, topics)
- Semantic Scholarcitation count (not merged with OpenAlex)
Abstract
Abstract not compiled yet; it will appear after the DergiPark / OpenAlex queue runs.
Topics
Citations
OpenAlex cited_by_count. Not a WoS or Scopus citation count; those sources have no separate column here.
6citationsOpenAlex · cited_by_count (cache / database)