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akaturk Academic measurement
  1. Ana Dal Fen Bilimleri ve Matematik Temel Alanı
  2. Yan Dal Kimya
Articles 44 YÖKSİS 44 · OpenAlex 0 Total citations 2,476 h-index 28 · OpenAlex Q1 articles 40 Scopus · WoS Q1 27 Top 2% world rank #131,430 Stanford / Elsevier 2026 Best field rank #1,127 / 11,969 Main field · top 9.4% Co-authors 6 1 Turkish institutions

Citation impact

OpenAlex YÖKSİS articles matched in OpenAlex: 44 + YÖKSİS · co-author record: 23
h-index 28 Percentile in Türkiye: 98 #20 of 245 at their university by h-index
i10-index
55
Total citations
2,476
Top 1.8% in Türkiye
Per article
37.0
FWCI
1.76
1.00 = world average
World top 1%
1
World top 10%
11
How is this computed?

h-index and citations are computed from the citation counts of this academic’s YÖKSİS articles matched in OpenAlex (not Google Scholar, WoS or Scopus). Unmatched articles are not included. 23 articles (556 citations) tagged with this academic’s YÖK author id in co-authors’ YÖKSİS records count only towards citations, h-index and i10; article counts, percentiles and rankings use their own YÖKSİS list.

World’s top 2% scientists

Stanford / Elsevier · 2026
World rank
131,430
career list
Composite c-score
3.38
excluding self-citations
h-index
36
hm 18.8
Sub-field rank
2332
Chemical Physics

The 2026 list (v9) prepared by Stanford University and Elsevier from Scopus data; indicators exclude self-citations. See the Türkiye list →

Field ranking

YÖKSİS ?
Keyword rankings 3

Collaboration network

From the author lists of YÖKSİS publication records. Duplicate records of a work count once; institutions are co-authors’ current YÖKSİS affiliations.

Co-authors
6
With an akaturk profile
2
Turkish institutions
1
Co-authored works
%5

Academic co-authors 2

  1. BURAK ÜLGÜT Profesör · İhsan Doğramacı Bilkent Üniversitesi same university 2
  2. YUNUS EMRE TÜRKMEN Doçent · Orta Doğu Teknik Üniversitesi 1

National collaboration 1 institutions

Within own university2 joint works · İhsan Doğramacı Bilkent Üniversitesi

  1. Orta Doğu Teknik Üniversitesi 1 works · 1 academics

Other co-authors (incl. international) 4

Coskun KocabasMerve Taner CamciP. Aydogan GokturkSelin Ezgi Dönmez

Authors without an akaturk profile (international researchers, retired or former academics, students, clinicians) are grouped by name spelling; short forms such as “Gulluce M.” join the single full name they match.

Indexes and citation percentiles

?
TR Index 0 articles
OpenAlex citation percentile
Top 1%1
Top 10%8
Avg · n 44 %76.6
Other counts

Scopus (SJR)

  • YÖKSİS rows 44

WoS (JCR)

  • YÖKSİS rows 44

Articles

Articles with YÖKSİS and OpenAlex source split; narrow by quartile or TR Index.

44articles

Journals with publications

27 journals

Narrow down

Scopus (SJR)
Q140 Q23 Q31 Q40
WoS (JCR)
Q127 Q215 Q32 Q40
TR Index
0articles

Article list

  1. 2019 Chemically addressed switching measurements in graphene electrode memristive devices using in situ XPS FARADAY DISCUSSIONS DOI 10.1039/c8fd00129d YÖKSİS SJR Q1 JCR Q2 OpenAlex 65.9%
  2. 2019 AC Electrowetting Modulation of Low-Volatile Liquids Probed by XPS: Dipolar vs Ionic Screening LANGMUIR DOI 10.1021/acs.langmuir.8b04099 YÖKSİS SJR Q1 JCR Q2 OpenAlex 64.2%
  3. 2018 Graphene-Based Adaptive Thermal Camouflage NANO LETTERS DOI 10.1021/acs.nanolett.8b01746 YÖKSİS SJR Q1 JCR Q1 OpenAlex top 1% OpenAlex 99.8%
  4. 2018 DC Electrowetting of Nonaqueous Liquid Revisited by XPS LANGMUIR DOI 10.1021/acs.langmuir.8b01314 YÖKSİS SJR Q1 JCR Q2 OpenAlex 67.0%
  5. 2018 In Situ XPS Reveals Voltage Driven Asymmetric Ion Movement of an Ionic Liquid through the Pores of a Multilayer Graphene Electrode JOURNAL OF PHYSICAL CHEMISTRY C DOI 10.1021/acs.jpcc.8b02759 YÖKSİS SJR Q1 JCR Q1 OpenAlex 83.3%
  6. 2018 XPS investigation of the vacuum interface of an ionic liquid under triangular electrical excitation for slow transients Analytical Methods DOI 10.1039/C8AY01488D YÖKSİS SJR Q1 JCR Q2 OpenAlex 39.8%
  7. 2017 Raman and X-Ray photoelectron spectroscopic studies of graphene devices for identification of doping APPLIED SURFACE SCIENCE DOI 10.1016/j.apsusc.2017.07.097 YÖKSİS SJR Q1 JCR Q1 OpenAlex 68.9%
  8. 2017 Optical and XPS evidence for the electrochemical generation of an N-heterocyclic carbene and its CS2 adduct from the ionic liquid [bmim][PF6] NEW JOURNAL OF CHEMISTRY DOI 10.1039/c7nj01996c YÖKSİS SJR Q1 JCR Q2 OpenAlex 70.9%
  9. 2016 The effect of polar end of long-chain fluorocarbon oligomers in promoting the superamphiphobic property over multi-scale rough Al alloy surfaces APPLIED SURFACE SCIENCE DOI 10.1016/j.apsusc.2016.04.050 YÖKSİS SJR Q1 JCR Q1 OpenAlex top 10% OpenAlex 90.7%
  10. 2016 XPS enables visualization of electrode potential screening in an ionic liquid medium with temporal-and lateral-resolution PHYSICAL CHEMISTRY CHEMICAL PHYSICS DOI 10.1039/c6cp04933h YÖKSİS SJR Q1 JCR Q1 OpenAlex top 10% OpenAlex 91.3%
  11. 2016 Monitoring the operation of a graphene transistor in an integrated circuit by XPS ORGANIC ELECTRONICS DOI 10.1016/j.orgel.2016.06.027 YÖKSİS SJR Q1 JCR Q1 OpenAlex 72.4%
  12. 2015 Voltage contrast X-ray photoelectron spectroscopy reveals graphene-substrate interaction in graphene devices fabricated on the C- and Si-faces of SiC APPLIED PHYSICS LETTERS DOI 10.1063/1.4931725 YÖKSİS SJR Q1 JCR Q1 OpenAlex 60.4%
  13. 2015 Chemical Visualization of a GaN p-n junction by XPS SCIENTIFIC REPORTS DOI 10.1038/srep14091 YÖKSİS SJR Q1 JCR Q1 OpenAlex 78.6%
  14. 2014 Gate-Tunable Photoemission from Graphene Transistors NANO LETTERS DOI 10.1021/nl500842y YÖKSİS SJR Q1 JCR Q1 OpenAlex 88.7%
  15. 2014 Tribological interaction between polytetrafluoroethylene and silicon oxide surfaces JOURNAL OF CHEMICAL PHYSICS DOI 10.1063/1.4898384 YÖKSİS SJR Q1 JCR Q1 OpenAlex 81.8%
  16. 2014 XPS for probing the dynamics of surface voltage and photovoltage in GaN APPLIED SURFACE SCIENCE DOI 10.1016/j.apsusc.2014.06.089 YÖKSİS SJR Q1 JCR Q1 OpenAlex 80.4%
  17. 2013 Synthesis and Characterization of Zn(1-x)NixAl2O4 Spinels as a New Heterogeneous Catalyst of Biginelli’xxs Reaction BULLETIN OF THE KOREAN CHEMICAL SOCIETY DOI 10.5012/bkcs.2013.34.5.1445 YÖKSİS SJR Q3 JCR Q3 OpenAlex 63.3%
  18. 2013 Band-Bending at Buried SiO2/Si Interface as Probed by XPS ACS APPLIED MATERIALS INTERFACES DOI 10.1021/am401696e YÖKSİS SJR Q1 JCR Q1 OpenAlex 84.0%
  19. 2013 XPS for chemical- and charge-sensitive analyses THIN SOLID FILMS DOI 10.1016/j.tsf.2013.02.002 YÖKSİS SJR Q1 JCR Q2 OpenAlex top 10% OpenAlex 94.3%
  20. 2013 CeOx/Al2O3 thin films on stainless steel substrate - Dynamical X-ray photoelectron spectroscopy investigations THIN SOLID FILMS DOI 10.1016/j.tsf.2013.03.049 YÖKSİS SJR Q1 JCR Q2 OpenAlex 54.8%

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