- Ana Dal Fen Bilimleri ve Matematik Temel Alanı
- Yan Dal Fizik
Keywords
YÖKSİS
Citation impact
OpenAlex YÖKSİS articles matched in OpenAlex: 9 + YÖKSİS · co-author record: 4
h-index
4
Percentile in Türkiye: 53
#508 of 1,337 at their university by h-index
- i10-index
- 2
- Total citations
- 63 Top 48% in Türkiye
- Per article
- 4.8
- FWCI
- 0.41 1.00 = world average
- World top 1%
- 0
- World top 10%
- 0
Most cited articles
- Metastability effects in hydrogenated microcrystalline silicon thin films investigated by the dual beam photoconductivity method
- Instability effects in hydrogenated microcrystalline silicon thin films
- Diffusion length measurements of microcrystalline silicon thin films prepared by hot-wire/catalytic chemical vapor deposition (HWCVD)
How is this computed?
h-index and citations are computed from the citation counts of this academic’s YÖKSİS articles matched in OpenAlex (not Google Scholar, WoS or Scopus). Unmatched articles are not included. 4 articles (13 citations) tagged with this academic’s YÖK author id in co-authors’ YÖKSİS records count only towards citations, h-index and i10; article counts, percentiles and rankings use their own YÖKSİS list.
Field ranking
YÖKSİS ?-
Main field Fen Bilimleri ve Matematik Temel AlanıPoints rank #4,937/ 11,969 top 41.2% At university #71/ 166Score 15.6 journal 15.6 · OA add 0
- Article rank2,194/11,969
- Scopus rank7,102/11,969
- WoS rank8,019/11,969
- YÖKSİS47
- Scopus10
- WoS7
-
Side field FizikPoints rank #1,206/ 2,615 top 46.1% At university #12/ 29Score 15.6 journal 15.6 · OA add 0
- Article rank510/2,615
- Scopus rank1,640/2,615
- WoS rank1,829/2,615
- YÖKSİS47
- Scopus10
- WoS7
Keyword rankings 3
-
Kw. Yarı İletkenlerPoints rank #261/ 526 top 49.6% At university #4/ 11Score 15.6 journal 15.6 · OA add 0
-
Kw. Yenilenebilir EnerjiPoints rank #38/ 71 top 53.5% At university #2/ 3Score 15.6 journal 15.6 · OA add 0
-
Kw. Yoğun Madde FiziğiPoints rank #461/ 786 top 58.7% At university #7/ 16Score 15.6 journal 15.6 · OA add 0
Collaboration network
From the author lists of YÖKSİS publication records. Duplicate records of a work count once; institutions are co-authors’ current YÖKSİS affiliations.
- Co-authors
- 50
- With an akaturk profile
- 0
- Turkish institutions
- 0
- Co-authored works
- %100
Academic co-authors 0
No co-author with an akaturk profile.
National collaboration 0 institutions
No joint work with another Turkish university.
Other co-authors (incl. international) 50
F FINGER 19C R WRONSKI 15GOKHAN YILMAZ 9R E JOHANSON 9S O KASAP 9R W COLLINS 8REINHARD CARIUS 8VLADIMIR SMIRNOV 8R M DAWSON 7SALİH OKUR 7RUDOLF BRUEGGEMANN 6OKTAY GÖKTAS 5ELİF TURAN 4HAMZA CANSEVER 4HUSEYIN MUZAFFER ŞAGBAN 4JOSEF KLOMFASS 4Somnath NAG 4Y M LI 4ILSIN AN 3Y LU 3ANDREAS LAMBERTZ 2C M FORTMANN 2D E HELLER 2J C YANG 2M BENNETT 2NEBILE ISIK 2S GUHA 2STEPHAN KLEIN 2WAKAGI MASATOSHI 2Arno H. M. SmetsDENIZ AKDASELENA ATANASSOVAENGIN OZKOLF RUBİNELLIGIZEM NOGAYJimmy MelskensKaren WilkenM E D YAVASM E DONERTASNAGI MALEY
Show all (50)
PINAR OZDAGQUI WANGRASIT TURANS J FONASHS KIMS LeeShuo WangT J MCMAHONY LEEZ M SALEH
Authors without an akaturk profile (international researchers, retired or former academics, students, clinicians) are grouped by name spelling; short forms such as “Gulluce M.” join the single full name they match.
Indexes and citation percentiles
?Top 1%0
Top 10%0
Avg · n 10
%58.8
Other counts
Scopus (SJR)
- YÖKSİS rows 11
WoS (JCR)
- YÖKSİS rows 7
Articles
Articles with YÖKSİS and OpenAlex source split; narrow by quartile or TR Index.
Journals with publications
7 journals
- Physica Status Solidi (C) Current Topics in Solid State Physics 3
- Thin Solid Films 2
- Japanese Journal of Applied Physics 1
- Journal of Applied Physics 1
- Journal of Materials Science: Materials in Electronics 1
- Journal of Non-Crystalline Solids 1
- Physica Status Solidi (A) Applications and Materials Science 1
Narrow down
Article list
- 2023 The native and metastable defects and their joint density of states in hydrogenated amorphous silicon obtained from the improved dual beam photoconductivity method YÖKSİS SJR Q2 JCR Q2 OpenAlex 32.8%
- 2022 Understanding the Origin of Thermal Annealing Effects in Low\u2010Temperature Amorphous Silicon Films and Solar Cells YÖKSİS SJR Q2 JCR Q3 OpenAlex 46.0%
- 2020 The effects of air, oxygen and water exposure on the sub-bandgap absorption, the electronic conductivity and the ambipolar diffusion length in highly crystalline microcrystalline silicon films for photovoltaic applications YÖKSİS SJR Q2 JCR Q3
- 2014 Investigation of meta- and in-stability effects in hydrogenated microcrystalline silicon thin films by the steady-state measurement methods YÖKSİS
- 2014 Investigation of metastability and instability effects on the minority carrier transport properties of microcrystalline silicon thin films by using the steady-state photocarrier grating technique YÖKSİS
- 2014 Reversible and irreversible effects after oxygen exposure in thick (1 _m) silicon films deposited by VHF-PECVD on glass substrates investigated by dual beam photoconductivity YÖKSİS
- 2014 Atmospheric aging and light-induced degradation of amorphous and nanostructured silicon using photoconductivity and electron spin resonance YÖKSİS
- 2012 Metastability effects in hydrogenated microcrystalline silicon thin films investigated by the dual beam photoconductivity method YÖKSİS SJR Q1 JCR Q1 OpenAlex 83.9%
- 2012 Rapid Reversible Degradation of Silicon Thin Films by a Treatment in Water YÖKSİS SJR Q1 JCR Q3 OpenAlex 61.8%
- 2010 The effects of native and light induced defects on optoelectronic properties of hydrogenated amorphous silicon-germanium (a-SiGe:H) alloy thin films YÖKSİS
- 2010 The effect of aging on the dark conductivity and 1/ f noise in hydrogenated microcrystalline silicon thin films YÖKSİS SJR Q3 OpenAlex 68.5%
- 2010 Investigation of light induced degradation in hydrogenated amorphous silicon‐germanium alloy thin films using temperature dependent photoconductivity YÖKSİS SJR Q3 OpenAlex 10.8%
- 2010 Instability effects in hydrogenated microcrystalline silicon thin films YÖKSİS SJR Q3 OpenAlex 81.6%
- 2009 Investigation of meta- and in-stability effect in thin film silicon materials using intensity and temperature dependence of photoconductivity YÖKSİS
- 2006 Sub-bandgap optical absorption spectroscopy of hydrogenated microcrystalline silicon thin films prepared using hot-wire CVD (Cat-CVD) process YÖKSİS SJR Q1 JCR Q1 OpenAlex 66.4%
- 2006 Diffusion length measurements of microcrystalline silicon thin films prepared by hot-wire/catalytic chemical vapor deposition (HWCVD) YÖKSİS SJR Q1 JCR Q1 OpenAlex 67.4%
- 2005 The effects of oxide thickness on the interface properties of metal-tantalum pentoxide-Si capacitors YÖKSİS
- 2005 Minority carrier properties of microcrystalline silicon thin films grown by HW-CVD and VHF-PECVD techniques YÖKSİS
- 2005 Light induced degradation of hydrogenated amorphous-silicon germanium alloy (a-SiGe:H) thin films YÖKSİS
- 2005 Instability phenomena in microcrystalline silicon films YÖKSİS