Article detail · 1980
Admittance spectroscopy: A powerful characterization technique for semiconductor crystals—Application to ZnTe
Journal
Solid-State Electronics
OpenAlex
SJR Q1
JCR Q2
Citations 139
Percentile 88.7%
FWCI 2.48
- Year
- 1980
- Type
- article
Data source split
- YÖKSİS venue Solid-State Electronics
- OpenAlex OpenAlex enrichment (abstract, citations, topics)
Abstract
Abstract not compiled yet; it will appear after the DergiPark / OpenAlex queue runs.
Topics
Citations
OpenAlex cited_by_count. Not a WoS or Scopus citation count; those sources have no separate column here.
139 citations
OpenAlex cited_by_count (cache / database)
3 publications in the local catalog that cite this work (OpenAlex reference match; not the full global list).
- Negative capacitance in a novel bidirectional p-i-n diode for near-infrared LED and photodetector applications 2025
- Rapid determination of a Si H gap states by double beam photocapacitance 1995
- Negative Capacitance in a Novel Bidirectional P-I-N Diode for Near-Infrared Led and Photodetector Applications 2025