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akaturk Academic measurement

Article detail · 2018

M.E. Aydın and A. Türüt, “The electrical characteristics of Sn/methyl-red/p-type Si/Al Contacts”, Microelectronic Engineering 84 (2007) 2875-2882

Journal Microelectronic Engineering
YÖKSİS
Year2018
Scopus (SJR)Q1
WoS (JCR)Q3

Data source split

  • YÖKSİSYÖKSİS article record
  • YÖKSİS venueMicroelectronic Engineering

Abstract

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Authors

2
  1. MEHMET ENVER AYDIN DİCLE ÜNİVERSİTESİ 1
  2. ABDULMECİT TURUT 2