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Article detail · 2009

Temperature-dependent current-voltage and capacitance-voltage characteristics of the Ag/n-InP/In Schottky diodes

Journal

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS

ISSN 0957-4522

The ISSN points to another catalog journal; the name is from the YÖKSİS record.

YÖKSİS OpenAlex SJR Q2 JCR Q2 Citations 37 Percentile 77.2% FWCI 1.2

Year: 2009
DOI: 10.1007/s10854-008-9635-z
Type: article

Data source split

YÖKSİS YÖKSİS article record
YÖKSİS venue JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Catalog match (ISSN) Journal of Materials Science: Materials in Electronics
OpenAlex OpenAlex enrichment (abstract, citations, topics)

OpenAlex record

Abstract

No OpenAlex abstract is available for this article yet.

Topics

Semiconductor materials and interfaces
Integrated Circuits and Semiconductor Failure Analysis
Semiconductor materials and devices

Primary topic Semiconductor materials and interfaces

Authors

FULYA ESRA CİMİLLİ ÇATIR ERZİNCAN BİNALİ YILDIRIM ÜNİVERSİTESİ
HASAN EFEOĞLU
MUSTAFA SAĞLAM
ABDULMECİT TURUT

Index information

WoS (JCR) and Scopus (SJR) quartiles by ISSN and publication year. · 2009

Scopus (SJR) / WoS (JCR)

Journal of Materials Science: Materials in Electronics

Scopus (SJR) Q2 0,575 Nearest year: 2010

Article year 2009; shown index year 2010.

WoS (JCR) Q2 JIF 1 Year 2009

Universities

ERZİNCAN BİNALİ YILDIRIM ÜNİVERSİTESİ