Academician
ENES ATAÇ
Araştırma Görevlisi
İzmir Yüksek Teknoloji Enstitüsü İzmir Yüksek Teknoloji Enstitüsü Mühendislik Fakültesi
Citation impact
OpenAlex YÖKSİS articles matched in OpenAlex: 14
h-index
4
Percentile in Türkiye: 53
#217 of 406 at their university by h-index
- i10-index
- 0
- Total citations
- 31 Top 55% in Türkiye
- Per article
- 2.2
- FWCI
- 1.56 1.00 = world average
- World top 1%
- 0
- World top 10%
- 3
Most cited articles
- Papercraft Doppler Radar Measurements Based on Covariance Eigenvalue Spectrum-Assisted Empirical Mode Decomposition
- Subwavelength thickness characterization of curved dielectric films exploiting spatially structured entangled photons
- Nanoscale curved dielectric film characterization beyond diffraction limits using spatially structured illumination
How is this computed?
h-index and citations are computed from the citation counts of this academic’s YÖKSİS articles matched in OpenAlex (not Google Scholar, WoS or Scopus). Unmatched articles are not included. h-index on the OpenAlex author profile: 4.
Field ranking
YÖKSİS ?-
Main field Mühendislik Temel AlanıPoints rank #7,889/ 24,860 top 31.7% At university #91/ 258Score 13.15 journal 12.4 · OA add 0.75
- Article rank10,406/24,860
- Scopus rank7,180/24,860
- WoS rank6,917/24,860
- YÖKSİS14
- Scopus14
- WoS14
-
Side field Elektrik-Elektronik ve Haberleşme MühendisliğiPoints rank #835/ 2,948 top 28.3% At university #10/ 24Score 13.15 journal 12.4 · OA add 0.75
- Article rank1,185/2,948
- Scopus rank766/2,948
- WoS rank729/2,948
- YÖKSİS14
- Scopus14
- WoS14
Keyword rankings 3
-
Kw. Elektromanyetik- Mikrodalga ve Anten TeknolojileriPoints rank #128/ 342 top 37.4% At university #2/ 2Score 13.15 journal 12.4 · OA add 0.75
-
Kw. Kuantum TeknolojileriPoints rank #6/ 11 top 54.5% At university #1/ 1Score 13.15 journal 12.4 · OA add 0.75
-
Kw. Optik- FotonikPoints rank #63/ 136 top 46.3% At university #3/ 3Score 13.15 journal 12.4 · OA add 0.75
Collaboration network
From the author lists of YÖKSİS publication records. Duplicate records of a work count once; institutions are co-authors’ current YÖKSİS affiliations.
- Co-authors
- 4
- With an akaturk profile
- 4
- Turkish institutions
- 2
- Co-authored works
- %100
Academic co-authors 4
- ANIL KARATAY Doktor Öğretim Üyesi · İzmir Demokrasi Üniversitesi 11
- MEHMET SALİH DİNLEYİCİ Profesör · İzmir Yüksek Teknoloji Enstitüsü same university 6
- FATİH ONAY Araştırma Görevlisi · Bursa Teknik Üniversitesi 2
- FATİH YAMAN Doçent · İzmir Yüksek Teknoloji Enstitüsü same university 2
National collaboration 2 institutions
Within own university7 joint works · İzmir Yüksek Teknoloji Enstitüsü
- İzmir Demokrasi Üniversitesi 11 works · 1 academics
- Bursa Teknik Üniversitesi 2 works · 1 academics
Indexes and citation percentiles
?Top 1%0
Top 10%3
Avg · n 14
%49.2
Other counts
Scopus (SJR)
- YÖKSİS rows 14
WoS (JCR)
- YÖKSİS rows 14
Articles
Articles with YÖKSİS and OpenAlex source split; narrow by quartile or TR Index.
Journals with publications
10 journals
- IEEE Transactions on Instrumentation and Measurement 3
- Journal of Electromagnetic Waves and Applications 2
- Measurement Science and Technology 2
- ISSN 1434-8411 1
- IEEE Sensors Journal 1
- IEEE Transactions on Antennas and Propagation 1
- Journal of the Optical Society of America B: Optical Physics 1
- Optical Fiber Technology 1
- Optics and Laser Technology 1
- Physica Scripta 1
Narrow down
Article list
- 2026 Coherent Detection of Fiber-Induced Phase Perturbations for High-Sensitivity Refractive Index Sensing of Transparent Liquids YÖKSİS SJR Q1 JCR Q1 OpenAlex 32.8%
- 2026 Quasi two-way shape-memory alloy-excited reconfigurable cavity for in-pipe water monitoring YÖKSİS SJR Q2 JCR Q1 OpenAlex 15.6%
- 2026 Highly sensitive relative humidity sensor based on confocal phase diffraction from dielectric film-coated optical fiber array YÖKSİS SJR Q3 JCR Q4 OpenAlex 22.1%
- 2026 High-Sensitivity Thickness Measurement of Transparent Optical Thin Films via EEMD-Based Fresnel Phase Diffraction YÖKSİS SJR Q1 JCR Q1 OpenAlex 23.7%
- 2025 Improving Doppler radar performance through optically-reconfigurable unequal power division with semi-analytical approach YÖKSİS SJR Q3 JCR Q4 OpenAlex 39.4%
- 2025 Thermally reconfigurable quad-port MIMO antenna with independent frequency tuning YÖKSİS SJR Q2 JCR Q2 OpenAlex top 10% OpenAlex 97.5%
- 2025 Homodyne detection based confocal phase diffraction method for thickness characterization of ultra-thin dielectric films coated on optical fibers YÖKSİS SJR Q1 JCR Q1 OpenAlex 75.2%
- 2025 Practical and Cost-Effective Approach for Thermal Light Characterization Based on Confined Area Measurements YÖKSİS SJR Q1 JCR Q1 OpenAlex 10.6%
- 2025 Papercraft Doppler Radar Measurements Based on Covariance Eigenvalue Spectrum-Assisted Empirical Mode Decomposition YÖKSİS SJR Q1 JCR Q1 OpenAlex top 10% OpenAlex 91.5%
- 2025 Spiral-shaped dual-port microstrip antenna for 5G/6G applications with wideband-to-narrowband transition using shape-memory alloy YÖKSİS SJR Q2 JCR Q2 OpenAlex top 10% OpenAlex 95.7%
- 2024 Toward Cost-Effective and Lightweight Doppler Radars: Papercraft-Based Components and Comparisons With Aluminum and 3-D Printed Alternatives YÖKSİS SJR Q1 JCR Q1 OpenAlex 53.6%
- 2023 Enhancing thickness determination of nanoscale dielectric films in phase diffraction-based optical characterization systems with radial basis function neural networks YÖKSİS SJR Q2 JCR Q1 OpenAlex 42.0%
- 2023 Subwavelength thickness characterization of curved dielectric films exploiting spatially structured entangled photons YÖKSİS SJR Q2 JCR Q3 OpenAlex 45.5%
- 2020 Nanoscale curved dielectric film characterization beyond diffraction limits using spatially structured illumination YÖKSİS SJR Q2 JCR Q2 OpenAlex 44.3%