Article detail · 2018 · article
Effectuality of Barrier Height Inhomogeneity on the Current–Voltage–Temperature Characteristics of Metal Semiconductor Structures with CdZnO Interlayer
Journal
Journal of Electronic Materials
ISSN0361-5235
YÖKSİS
OpenAlex
Top 10%
Year2018
Citations53OpenAlex
Citations46Semantic Scholar
Percentile%96.1
FWCI4.681.00 = world average
Scopus (SJR)Q2
WoS (JCR)Q3
Data source split
- YÖKSİSYÖKSİS article record
- YÖKSİS venueJournal of Electronic Materials
- Catalog match (ISSN)Journal of Electronic Materials
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- Semantic Scholarcitation count (not merged with OpenAlex)
Abstract
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Topics
Citations
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53citationsOpenAlex · cited_by_count (cache / database)
74 publications in the local catalog that cite this work (OpenAlex reference match; not the full global list).
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