Article detail · 2018
New serial resistance equations: Derivated from Cheungs functions for the forward and reverse bias I
Journal
Elsevier BV / Microelectronic EngineeringISSN 0167-9317
The ISSN points to another catalog journal; the name is from the YÖKSİS record.
YÖKSİS
SJR Q1
JCR Q3
- Year
- 2018
Data source split
- YÖKSİS YÖKSİS article record
- YÖKSİS venue Elsevier BV / Microelectronic Engineering
- Catalog match (ISSN) Microelectronic Engineering
Abstract
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