Article detail · 2021
Frequency and voltage-dependent dielectric spectroscopy characterization of Al/(Coumarin-PVA)/p-Si structures
YÖKSİS
OpenAlex
SJR Q2
JCR Q2
Citations 42
Top 10%
Percentile 94.7%
FWCI 3.95
- Year
- 2021
- Type
- article
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- YÖKSİS YÖKSİS article record
- YÖKSİS venue Journal of Materials Science: Materials in Electronics
- Catalog match (ISSN) Journal of Materials Science: Materials in Electronics
- OpenAlex OpenAlex enrichment (abstract, citations, topics)
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42 citations
OpenAlex cited_by_count (cache / database)
19 publications in the local catalog that cite this work (OpenAlex reference match; not the full global list).
- Origin of frequency and voltage dependent negative dielectric properties in the Al/p-Si Schottky diodes with (Cd0.3Zn0.7O) interfacial layer in the wide range of frequency and voltage 2023
- Overview of the irradiation-dependent behaviour of the negative dielectric properties of GaAs-based MIS devices 2024
- Overview of the irradiation-dependent behaviour of the negative dielectric properties of GaAs-based MIS devices 2024
- Interface and dielectric properties of Al/p-Si diode by organic composite interlayer for MOS 2025
- Dielectric, Conductivity and Modulus Properties of Au/ZnO/p-InP (MOS) Capacitor 2023
- The capacitance/conductance and surface state intensity characteristics of the Al/(CMAT)/p-Si structures 2024
- Determining the dielectric characteristics of the Au/C20H12/n-Si (MPS) structure over a wide temperature and voltage 2024
- Frequency dependent dielectric spectroscopy of Au/n-Si structure with stannic oxide (SnO2) interfacial layer 2023
- Frequency dependent dielectric spectroscopy of Au/n-Si structure with stannic oxide (SnO2) interfacial layer 2023
- Hybrid photonic device based on Graphene Oxide (GO) doped P3HT-PCBM/p-Silicon for photonic applications 2023