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akaturk Academic measurement
  1. Ana Dal Fen Bilimleri ve Matematik Temel Alanı
  2. Yan Dal Fizik
Keywords YÖKSİS
Academic summary YÖKSİS and OpenAlex counted separately.
Articles 47
YÖKSİS47 OpenAlex0
Projects 6
Books 4
Proceedings 50

Citation impact

OpenAlex YÖKSİS articles matched in OpenAlex: 37
h-index 14 Percentile in Türkiye: 93 #15 of 575 at their university by h-index
i10-index
20
Total citations
1,264
Top 3.2% in Türkiye
Per article
34.2
FWCI
2.59
1.00 = world average
World top 1%
2
World top 10%
15

h-index and citations are computed from the citation counts of this academic’s YÖKSİS articles matched in OpenAlex (not Google Scholar, WoS or Scopus). Unmatched articles are not included.

Field ranking

YÖKSİS ?

Index quartiles

?
Scopus (SJR) 34
  • Q1 7 %20.6
  • Q2 19 %55.9
  • Q3 7 %20.6
  • Q4 1 %2.9
WoS (JCR) 33
  • Q1 11 %33.3
  • Q2 13 %39.4
  • Q3 4 %12.1
  • Q4 5 %15.2
TR Index 6 articles
OpenAlex citation percentile
Top 1%2
Top 10%15
Avg · n 38 %70.6
Other counts

Scopus (SJR)

  • YÖKSİS rows 35

WoS (JCR)

  • YÖKSİS rows 34

Articles

Articles with YÖKSİS and OpenAlex source split; narrow by quartile or TR Index.

47articles

Journals with publications

33 journals

Narrow down

Scopus (SJR)
WoS (JCR)
TR Index

Article filter applied. Journal filter: Journal of Materials Science: Materials in Electronics Clear filter ×

Article list

2 / 47 articles

  1. 2021 Understanding the role of Bi2O3 in the P2O5–CaO–Na2O–K2O glass system in terms of physical, structural and radiation shielding properties Journal of Materials Science: Materials in Electronics DOI 10.1007/s10854-021-05775-z YÖKSİS SJR Q2 JCR Q2 OpenAlex 84.1%
  2. 2021 An investigation into gamma radiation shielding parameters of the (Al:Si) and (Al+Na):Si-doped international simple glasses (ISG) used in nuclear waste management, deploying Phy-X/PSD and SRIM software Journal of Materials Science: Materials in Electronics DOI 10.1007/s10854-021-05904-8 YÖKSİS SJR Q2 JCR Q2 OpenAlex top 10% OpenAlex 98.5%

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