Academician
ADEM TATAROĞLU
PROFESÖR
GAZİ ÜNİVERSİTESİ FEN FAKÜLTESİ FİZİK BÖLÜMÜ
- Ana Dal Fen Bilimleri ve Matematik Temel Alanı
- Yan Dal Fizik
Article counts come from two sources, each shown separately: YÖKSİS (academic declarations) and OpenAlex (open scholarly catalog). Patents and artistic activities are listed under the Works tabs below.
Index quartiles
Scopus (SJR)
149 Total
- Q1 41
- Q2 79
- Q3 28
- Q4 1
Other counts
- YÖKSİS rows 149 Q1 0 Q2 0 Q3 0 Q4 0
WoS (JCR)
149 Total
- Q1 25
- Q2 62
- Q3 43
- Q4 19
Other counts
- YÖKSİS rows 149 Q1 0 Q2 0 Q3 0 Q4 0
TR Index
2 articles
OpenAlex citation percentiles
OpenAlex citation percentile; covered works only (~52%).
What do these indicators mean?
- Q1–Q4: the quartile of the journal in the given index (Scopus/WoS). Q1 = top 25%, Q4 = bottom 25%.
- Top 1% / top 10%: number of works among the top 1% or 10% most-cited worldwide in the same field and year.
- Avg percentile: mean citation percentile of the works (100 = highest).
- Source: index quartiles from Scopus/WoS and TR Index flags; citation percentiles from OpenAlex.
Proceedings
Conference proceedings recorded in YÖKSİS.
Records
- 2018 Radiation effects on admittance measurements of MIS capacitor
- 2023 FREQUENCY DEPENDENCE OF ELECTRIC CHARACTERISTICS OF POLYMER BASED MPS DEVICE
- Ionizing Radiation Damage Effects on Admittance Measurements of Au/TiO2/n-Si (MIS) Capacitor
- 2015 Metal yalıtkan yarıiletken MIS kapasitörün akım gerilim karakteristikleri üzerine gama radyasyon etkileri
- 2015 Frequency dependent dielectric properties and ac conductivity of Bi3 25La0 75Ti3O12 thin film prepared by sol gel method
- 2017 Electrical Properties of Dilute Nitride GaAsPN/GaPN MQW p-i-n Diode
- 2014 Dielectric Characteristics of Gamma Irradiated MOS Capacitor
- 2017 The Effect of Thickness on the Optical, Structural and Electrical Properties of ZnO Thin Film Deposited on n-type Si
- 2016 Temperature dependence of current voltage characteristics of AuGe n Ge AuGe Schottky diode
- 2018 Frequency dependence of dielectric properties of Al/N-T Nft/p-Si/Al Structure
- 2018 Dielectric Properties of MOS Device Based on TiO2/SiO2 Oxide Layer
- 2014 Metal Oksit Yarıiletken MOS Kapasitörün Dielektrik Karakteristiklerine Sıcaklık Etkisi
- 2016 Frequency Dependent Dielectric Properties of Heterogeneous Structures
- 2022 On The Illumination Response of The Impedance Characteristics in Al/GrPVA/p-Si (MPS) Structure