2025
SJR Q2
JCR Q3 · 2,7
11 matched articles
SCIE
Journal detail
IEEE Transactions on Device and Materials Reliability
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Country
- United States · Northern America
- Type
- journal
- ISSN
-
1530438815582574
Integrated evaluation
Scopus side is Scimago SJR; WoS side is Master Journal List + JCR/JIF. Sources are matched on ISSN. WoS / JCR metrics are available for 1997 and later years only.
WoS / JCR data covers 1997 onward.
Scopus
Scopus · Scimago
- SJR 0,451
- Quartile Q2
- H-Index 85
- Cites/doc 2,8
- Docs (3y) 210
- Cites (3y) 625
Clarivate
Web of Science · JCR · 2025
- JCR Q Q3
- JIF 2,7
- 5Y JIF 2,6
- JCI 0,53
WoS indexes
- SCIE
Subject classification
Categories (SJR)
- Electrical and Electronic Engineering Q2
- Electronic, Optical and Magnetic Materials Q3
- Safety, Risk, Reliability and Quality Q2
Areas
- Engineering
- Materials Science
WoS categories
- Engineering, Electrical & Electronic | Physics, Applied
Yearly quartile comparison
Scimago (SJR) for all years; Clarivate (JCR / JIF / JCI) from 1997 onward. Latest year stays open; older years start collapsed.
WoS / JCR data covers 1997 onward.
| Year | SJR Q | JCR Q (1997+) | SJR | JIF (1997+) | 5Y JIF (1997+) | JCI (1997+) | JCI Q (1997+) | H-Index |
|---|---|---|---|---|---|---|---|---|
| 2025 | Q2 | Q3 | 0,451 | 2,7 | 2,6 | 0,53 | Q2 | 85 |
| 2024 | Q2 | Q3 | 0,533 | 2,3 | 2,2 | 0,51 | Q3 | 82 |
| 2023 | Q2 | Q2 | 0,436 | 2,5 | 2,1 | 0,52 | Q3 | 82 |
| 2022 | Q2 | Q3 | 0,401 | 2 | 2 | 0,47 | Q3 | 82 |
| 2021 | Q2 | Q3 | 0,458 | 1,9 | 2 | 0,46 | Q3 | 82 |
| 2020 | Q2 | Q3 | 0,384 | 1,8 | 1,8 | 0,42 | Q3 | 82 |
| 2019 | Q2 | Q3 | 0,416 | 1,4 | 1,5 | 0,44 | Q3 | 82 |
| 2018 | — | Q3 | — | 1,6 | 1,7 | 0,45 | Q3 | — |
| 2017 | Q2 | Q3 | 0,44 | 1,5 | 1,7 | 0,55 | Q2 | 82 |
| 2016 | Q2 | Q3 | 0,444 | 1,6 | 1,7 | — | — | 82 |
| 2015 | Q1 | Q2 | 0,729 | 1,4 | 1,5 | — | — | 82 |
| 2014 | Q1 | Q2 | 0,825 | 1,9 | 1,9 | — | — | 82 |
| 2013 | Q1 | Q2 | 0,762 | 1,5 | 1,7 | — | — | 82 |
| 2012 | Q1 | Q2 | 0,831 | 1,5 | 1,8 | — | — | 82 |
| 2011 | Q1 | Q2 | 1,007 | 1,5 | 1,7 | — | — | 82 |
| 2010 | Q1 | Q2 | 0,777 | 1,5 | 1,6 | — | — | 82 |
| 2009 | — | Q1 | — | 1,9 | 2,1 | — | — | — |
| 2008 | — | Q2 | — | 1,3 | 2,1 | — | — | — |
| 2007 | — | Q1 | — | 1,6 | — | — | — | — |
| 2006 | — | Q1 | — | 1,4 | — | — | — | — |
| 2005 | — | Q2 | — | 1 | — | — | — | — |
JCR category quartile history
JCR / JCI quartile by year and category. 1997 and later.
WoS / JCR data covers 1997 onward.
| Year | Category | Edition | JCR Q (1997+) | JCI Q (1997+) | Rank |
|---|---|---|---|---|---|
| 2025 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | Q3 | 186/369 |
| 2025 | PHYSICS, APPLIED | SCIE | Q3 | Q2 | 107/191 |
| 2024 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | Q3 | 198/368 |
| 2024 | PHYSICS, APPLIED | SCIE | Q3 | Q3 | 114/187 |
| 2023 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q2 | Q3 | 166/353 |
| 2023 | PHYSICS, APPLIED | SCIE | Q2 | Q3 | 87/179 |
| 2022 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | Q3 | 187/275 |
| 2022 | PHYSICS, APPLIED | SCIE | Q3 | Q3 | 108/160 |
| 2021 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | Q3 | 188/276 |
| 2021 | PHYSICS, APPLIED | SCIE | Q3 | Q3 | 112/161 |
| 2020 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | Q3 | 186/273 |
| 2020 | PHYSICS, APPLIED | SCIE | Q3 | Q3 | 111/160 |
| 2019 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | Q3 | 191/266 |
| 2019 | PHYSICS, APPLIED | SCIE | Q3 | Q3 | 112/155 |
| 2018 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | Q3 | 171/266 |
| 2018 | PHYSICS, APPLIED | SCIE | Q3 | Q3 | 94/148 |
| 2017 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | Q3 | 156/260 |
| 2017 | PHYSICS, APPLIED | SCIE | Q3 | Q2 | 89/146 |
| 2016 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | — | 143/262 |
| 2016 | PHYSICS, APPLIED | SCIE | Q3 | — | 81/148 |
| 2015 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q2 | — | 113/257 |
| 2015 | PHYSICS, APPLIED | SCIE | Q3 | — | 84/145 |
| 2014 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q2 | — | 69/249 |
| 2014 | PHYSICS, APPLIED | SCIE | Q2 | — | 53/144 |
| 2013 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q2 | — | 95/248 |
| 2013 | PHYSICS, APPLIED | SCIE | Q2 | — | 64/136 |
| 2012 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q2 | — | 85/243 |
| 2012 | PHYSICS, APPLIED | SCIE | Q2 | — | 57/128 |
| 2011 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q2 | — | 76/245 |
| 2011 | PHYSICS, APPLIED | SCIE | Q2 | — | 53/125 |
| 2010 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q2 | — | 73/247 |
| 2010 | PHYSICS, APPLIED | SCIE | Q2 | — | 51/118 |
| 2009 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q1 | — | 45/246 |
| 2009 | PHYSICS, APPLIED | SCIE | Q2 | — | 30/108 |
| 2008 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q2 | — | 95/229 |
| 2008 | PHYSICS, APPLIED | SCIE | Q3 | — | 52/95 |
| 2007 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q1 | — | 47/227 |
| 2007 | PHYSICS, APPLIED | SCIE | Q2 | — | 35/94 |
| 2006 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q1 | — | 49/206 |
| 2006 | PHYSICS, APPLIED | SCIE | Q2 | — | 36/84 |
| 2005 | ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q2 | — | 67/208 |
| 2005 | PHYSICS, APPLIED | SCIE | Q3 | — | 45/83 |