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Article detail · 2023

Analysis of Dielectric Characteristics of Lead Oxide/p-type Silicon Structure in a Wide Frequency and Voltage Region

Silicon

YÖKSİS OpenAlex ISSN 1876-990X DOI 10.1007/s12633-023-02301-0 Citations 5 SJR Q2 JCR Q3

10.1007/s12633-023-02301-0

YÖKSİS YÖKSİS article record

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Abstract

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Topics

  • Semiconductor materials and interfaces
  • Semiconductor materials and devices
  • Dielectric properties of ceramics

Type: article Semiconductor materials and interfaces

Index information

WoS (JCR) and Scopus (SJR) quartiles by ISSN and publication year. · 2023

Scopus (SJR) / WoS (JCR)

Silicon

Scopus (SJR) Q2 0,535 Year 2023
WoS (JCR) Q3 JIF 2,8 Year 2023

Universities

  • BATMAN ÜNİVERSİTESİ

Authors

  1. EMİNE ERDEM
  2. ÖMER GÜLLÜ BATMAN ÜNİVERSİTESİ