Makale detayı · 2021
Frequency and voltage-dependent dielectric spectroscopy characterization of Al/(Coumarin-PVA)/p-Si structures
Dergi
Springer Science and Business Media LLCISSN 0957-4522
ISSN kaydı başka bir dergiye işaret ediyor; ad YÖKSİS kaydından.
YÖKSİS
OpenAlex
SJR Q2
JCR Q2
Atıf 43
Üst %10
Yüzdelik 94.4%
FWCI 3.75
- Yıl
- 2021
- Tür
- article
Veri kaynağı ayrımı
- YÖKSİS YÖKSİS makale kaydı
- YÖKSİS dergi adı Springer Science and Business Media LLC
- Katalog eşleşmesi (ISSN) Journal of Materials Science: Materials in Electronics
- OpenAlex OpenAlex zenginleştirmesi (özet, atıf, konular)
Özet
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Konular
Atıflar
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43 atıf
OpenAlex cited_by_count (önbellek / veritabanı)
Yerel katalogda bu makaleye atıf yapan 43 yayın (OpenAlex referans eşleşmesi; tam dünya listesi değildir).
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- Origin of frequency and voltage dependent negative dielectric properties in the Al/p-Si Schottky diodes with (Cd0.3Zn0.7O) interfacial layer in the wide range of frequency and voltage 2023
- Origin of frequency and voltage dependent negative dielectric properties in the Al/p-Si Schottky diodes with (Cd0.3Zn0.7O) interfacial layer in the wide range of frequency and voltage 2023
- Overview of the irradiation-dependent behaviour of the negative dielectric properties of GaAs-based MIS devices 2024
- Overview of the irradiation-dependent behaviour of the negative dielectric properties of GaAs-based MIS devices 2024
- Interface and dielectric properties of Al/p-Si diode by organic composite interlayer for MOS 2025
- Interface and dielectric properties of Al/p-Si diode by organic composite interlayer for MOS 2025