Makale detayı · 2021
Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements
IEEE Microwave and Wireless Components Letters
YÖKSİS
OpenAlex
Açık erişim · green
SJR Q1
JCR Q2
Atıf 3
Yüzdelik 42.8%
FWCI 0.16
- Yıl
- 2021
- ISSN
1531-1309- Tür
- article
Veri kaynağı ayrımı
- YÖKSİS YÖKSİS makale kaydı
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Özet
İngilizce (OpenAlex)
A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air- and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X -band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.
Konular
- Microwave and Dielectric Measurement Techniques
- Microwave Engineering and Waveguides
- Electromagnetic Compatibility and Measurements
Birincil konu Microwave and Dielectric Measurement Techniques