Vertical CdTe:PVP/p-Si-Based Temperature Sensor by Using Aluminum Anode Schottky Contact

İngilizce (OpenAlex)

The vertical Schottky barrier diode (SBD)-based temperature sensors with the drive modes are a significant issue with more advantageous than the on-chip sensor. The sensitivity (${S}$) and the current conduction mechanisms (CCMs) of the vertical cadmium telluride (CdTe):polyvinyl pyrolidone (PVP)/${p}$-Si SBD were studied experimentally over the range of 80–340 K and compared with that of the lateral and vertical sensors. It is shown that the low and moderated voltages of the CdTe:PVP/${p}$-Si corresponding two linear regions of the current–voltage (${I}$–${V}$) outputs are around 0.1–0.3 and 0.4–0.65 V, respectively. The variation of Schottky barrier height (BH;${\sf \Phi } _{\text {Bo}}$) and ideality factor (${n}$) with temperature was obtained according to two linear regions. Energy dispersion of the interface traps (${N}_{\text {ss}}$) with changing temperature is additionally analyzed quantitatively. It is concluded that the thermionic-emission (TE) theory with double-Gaussian distribution (GD) is the dominant mechanism resulting the${I}$–${V}$characteristics of the vertical CdTe:PVP/${p}$-Si SBD in this study. Moreover, in the constant current, the${S}$values at the drive current of 10, 20, and$50~\mu \text{A}$were resulting in a range of −1.6 to −1.8 mV/K.